The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals

Andrzej Badzian

doi:doi:10.11648/j.am.20180704.11

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The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals

Andrzej Badzian

Published in Advances in Materials (Volume 7, Issue 4)

Received: 28 July 2018 Accepted: 11 October 2018 Published: 6 November 2018

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Abstract

X-ray diffraction from Chemical Vapor Deposition (CVD) gem-quality colorless diamond single crystals, grown with nitrogen addition in methane –hydrogen plasma mixture, was studied by imaging plate area detector (IPD) giving pixel pattern. Growth defects are responsible for rising x-ray diffuse scattering beyond reciprocal lattice points (rlp), described in the framework of kinematical theory of X-ray diffraction. In the particular case of CVD diamond crystals grown epitaxially on (001) substrate, the additional scattering in the close vicinity of rpl’s was registered. This observation was possible because of the improved angular resolution of x-ray intensity measurements using imaging plate detector (IPD). The pronounced differences in scattering around 111 rlp’s for natural and CVD <001> growth sector were demonstrated. Oscillation and stationary crystal methods allowed registration of diffraction spots that are different from natural diamond crystals. The diffraction patterns include features of short- and long-range atomic order. There are satellite reflections at the positions corresponding to the interatomic distances at 1.51 Å and 1.57 Å in the vicinity of 111 Bragg reflections, which are characteristic to 1.54 Å of cubic diamond. The displacement disorder of atoms, understood as disturbance of lattice periodicity can be explained by hypothesis about linear defects running in <110> and <-110> directions. Along <110> twin line tetrahedra share edges. Hydrogen atoms are presumably incorporated along this linear twin to protect chemical bonding stability. Bragg reflections exhibit anisotropy and considerable broadening compared to the diffraction standards. The ratio of peak intensity of forbidden by the diamond space group symmetry 222 reflection to 111 reflection is larger than for natural crystal. Raman spectra from (001) CVD crystals fit well to the spectrum from nearly perfect natural diamond crystal. The X-ray scattering around Bragg reflection is characteristic for a given crystal and can be applied as a gem quality criterion for distinguishing among crystals of different origin, or different growth sectors or grown by different methods. The scattering around 111 CVD diamond reflection is the strongest among the rlp’s.

Published in	Advances in Materials (Volume 7, Issue 4)
DOI	10.11648/j.am.20180704.11
Page(s)	89-104
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

Single Crystal Diamond, Microwave Plasma CVD, Defect Characterization, X-Ray Diffraction, Raman Spectroscopy, Scanning Tunneling Microscopy

References

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[17]	Lee, N. Microwave plasma-assisted chemical vapor deposition and characterization of (001) homoepitaxial diamond films, PhD Thesis, The Pennsylvania State University, May 1996.
[18]	Kuang, Y. Study of growth and nucleation of chemical vapor deposition diamond and amorphous silicon carbon alloy thin films, PhD Thesis, The Pennsylvania State University, May 1997.
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Andrzej Badzian. (2018). The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals. Advances in Materials, 7(4), 89-104. https://doi.org/10.11648/j.am.20180704.11

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ACS Style

Andrzej Badzian. The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals. Adv. Mater. 2018, 7(4), 89-104. doi: 10.11648/j.am.20180704.11

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AMA Style

Andrzej Badzian. The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals. Adv Mater. 2018;7(4):89-104. doi: 10.11648/j.am.20180704.11

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@article{10.11648/j.am.20180704.11,
  author = {Andrzej Badzian},
  title = {The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals},
  journal = {Advances in Materials},
  volume = {7},
  number = {4},
  pages = {89-104},
  doi = {10.11648/j.am.20180704.11},
  url = {https://doi.org/10.11648/j.am.20180704.11},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.am.20180704.11},
  abstract = {X-ray diffraction from Chemical Vapor Deposition (CVD) gem-quality colorless diamond single crystals, grown with nitrogen addition in methane –hydrogen plasma mixture, was studied by imaging plate area detector (IPD) giving pixel pattern. Growth defects are responsible for rising x-ray diffuse scattering beyond reciprocal lattice points (rlp), described in the framework of kinematical theory of X-ray diffraction. In the particular case of CVD diamond crystals grown epitaxially on (001) substrate, the additional scattering in the close vicinity of rpl’s was registered. This observation was possible because of the improved angular resolution of x-ray intensity measurements using imaging plate detector (IPD). The pronounced differences in scattering around 111 rlp’s for natural and CVD  growth sector were demonstrated. Oscillation and stationary crystal methods allowed registration of diffraction spots that are different from natural diamond crystals. The diffraction patterns include features of short- and long-range atomic order. There are satellite reflections at the positions corresponding to the interatomic distances at 1.51 Å and 1.57 Å in the vicinity of 111 Bragg reflections, which are characteristic to 1.54 Å of cubic diamond. The displacement disorder of atoms, understood as disturbance of lattice periodicity can be explained by hypothesis about linear defects running in  and  directions. Along  twin line tetrahedra share edges. Hydrogen atoms are presumably incorporated along this linear twin to protect chemical bonding stability. Bragg reflections exhibit anisotropy and considerable broadening compared to the diffraction standards. The ratio of peak intensity of forbidden by the diamond space group symmetry 222 reflection to 111 reflection is larger than for natural crystal. Raman spectra from (001) CVD crystals fit well to the spectrum from nearly perfect natural diamond crystal. The X-ray scattering around Bragg reflection is characteristic for a given crystal and can be applied as a gem quality criterion for distinguishing among crystals of different origin, or different growth sectors or grown by different methods. The scattering around 111 CVD diamond reflection is the strongest among the rlp’s.},
 year = {2018}
}

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TY - JOUR
T1 - The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals
AU - Andrzej Badzian
Y1 - 2018/11/06
PY - 2018
N1 - https://doi.org/10.11648/j.am.20180704.11
DO - 10.11648/j.am.20180704.11
T2 - Advances in Materials
JF - Advances in Materials
JO - Advances in Materials
SP - 89
EP - 104
PB - Science Publishing Group
SN - 2327-252X
UR - https://doi.org/10.11648/j.am.20180704.11
AB - X-ray diffraction from Chemical Vapor Deposition (CVD) gem-quality colorless diamond single crystals, grown with nitrogen addition in methane –hydrogen plasma mixture, was studied by imaging plate area detector (IPD) giving pixel pattern. Growth defects are responsible for rising x-ray diffuse scattering beyond reciprocal lattice points (rlp), described in the framework of kinematical theory of X-ray diffraction. In the particular case of CVD diamond crystals grown epitaxially on (001) substrate, the additional scattering in the close vicinity of rpl’s was registered. This observation was possible because of the improved angular resolution of x-ray intensity measurements using imaging plate detector (IPD). The pronounced differences in scattering around 111 rlp’s for natural and CVD growth sector were demonstrated. Oscillation and stationary crystal methods allowed registration of diffraction spots that are different from natural diamond crystals. The diffraction patterns include features of short- and long-range atomic order. There are satellite reflections at the positions corresponding to the interatomic distances at 1.51 Å and 1.57 Å in the vicinity of 111 Bragg reflections, which are characteristic to 1.54 Å of cubic diamond. The displacement disorder of atoms, understood as disturbance of lattice periodicity can be explained by hypothesis about linear defects running in and directions. Along twin line tetrahedra share edges. Hydrogen atoms are presumably incorporated along this linear twin to protect chemical bonding stability. Bragg reflections exhibit anisotropy and considerable broadening compared to the diffraction standards. The ratio of peak intensity of forbidden by the diamond space group symmetry 222 reflection to 111 reflection is larger than for natural crystal. Raman spectra from (001) CVD crystals fit well to the spectrum from nearly perfect natural diamond crystal. The X-ray scattering around Bragg reflection is characteristic for a given crystal and can be applied as a gem quality criterion for distinguishing among crystals of different origin, or different growth sectors or grown by different methods. The scattering around 111 CVD diamond reflection is the strongest among the rlp’s.
VL - 7
IS - 4
ER -

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Andrzej Badzian

Materials Research Institute, Pennsylvania State University, University Park, U.S.A

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Andrzej Badzian. (2018). The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals. Advances in Materials, 7(4), 89-104. https://doi.org/10.11648/j.am.20180704.11

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ACS Style

Andrzej Badzian. The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals. Adv. Mater. 2018, 7(4), 89-104. doi: 10.11648/j.am.20180704.11

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AMA Style

Andrzej Badzian. The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals. Adv Mater. 2018;7(4):89-104. doi: 10.11648/j.am.20180704.11

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@article{10.11648/j.am.20180704.11,
  author = {Andrzej Badzian},
  title = {The X-Ray Diffraction Method for Study of Growth Defects in CVD Diamond Single Crystals},
  journal = {Advances in Materials},
  volume = {7},
  number = {4},
  pages = {89-104},
  doi = {10.11648/j.am.20180704.11},
  url = {https://doi.org/10.11648/j.am.20180704.11},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.am.20180704.11},
  abstract = {X-ray diffraction from Chemical Vapor Deposition (CVD) gem-quality colorless diamond single crystals, grown with nitrogen addition in methane –hydrogen plasma mixture, was studied by imaging plate area detector (IPD) giving pixel pattern. Growth defects are responsible for rising x-ray diffuse scattering beyond reciprocal lattice points (rlp), described in the framework of kinematical theory of X-ray diffraction. In the particular case of CVD diamond crystals grown epitaxially on (001) substrate, the additional scattering in the close vicinity of rpl’s was registered. This observation was possible because of the improved angular resolution of x-ray intensity measurements using imaging plate detector (IPD). The pronounced differences in scattering around 111 rlp’s for natural and CVD  growth sector were demonstrated. Oscillation and stationary crystal methods allowed registration of diffraction spots that are different from natural diamond crystals. The diffraction patterns include features of short- and long-range atomic order. There are satellite reflections at the positions corresponding to the interatomic distances at 1.51 Å and 1.57 Å in the vicinity of 111 Bragg reflections, which are characteristic to 1.54 Å of cubic diamond. The displacement disorder of atoms, understood as disturbance of lattice periodicity can be explained by hypothesis about linear defects running in  and  directions. Along  twin line tetrahedra share edges. Hydrogen atoms are presumably incorporated along this linear twin to protect chemical bonding stability. Bragg reflections exhibit anisotropy and considerable broadening compared to the diffraction standards. The ratio of peak intensity of forbidden by the diamond space group symmetry 222 reflection to 111 reflection is larger than for natural crystal. Raman spectra from (001) CVD crystals fit well to the spectrum from nearly perfect natural diamond crystal. The X-ray scattering around Bragg reflection is characteristic for a given crystal and can be applied as a gem quality criterion for distinguishing among crystals of different origin, or different growth sectors or grown by different methods. The scattering around 111 CVD diamond reflection is the strongest among the rlp’s.},
 year = {2018}
}

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